A peak-current controlled single-inductor dual-output DC-DC buck converter with a time-multiplexing scheme

Wei Hsun Chang, Jia Hui Wang, Chien-Hung Tsai

研究成果: Conference contribution

11 引文 (Scopus)

摘要

This paper presents a peak current-controlled (PCC) single-inductor dual-output (SIDO) DC-DC buck converter with a time-multiplexing (TM) scheme. Small signal modeling, system compensation, and circuit implementation are discussed. Simulation and measurements confirm the effectiveness of the proposed method. The converter was fabricated using TSMC 0.35-μm CMOS technology. The input supply voltage is from 2.7-4.2V. Two outputs are specified at 2.5V/36mA and 1.8V/20mA, respectively, and operated at 500 KHz with a 1-μH inductor and 20-μF capacitors.

原文English
主出版物標題Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010
頁面331-334
頁數4
DOIs
出版狀態Published - 2010 十一月 8
事件2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010 - Hsin Chu, Taiwan
持續時間: 2010 四月 262010 四月 29

出版系列

名字Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010

Other

Other2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010
國家Taiwan
城市Hsin Chu
期間10-04-2610-04-29

指紋

DC-DC converters
Multiplexing
Capacitors
Networks (circuits)
Electric potential
Compensation and Redress

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

引用此文

Chang, W. H., Wang, J. H., & Tsai, C-H. (2010). A peak-current controlled single-inductor dual-output DC-DC buck converter with a time-multiplexing scheme. 於 Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010 (頁 331-334). [5496756] (Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010). https://doi.org/10.1109/VDAT.2010.5496756
Chang, Wei Hsun ; Wang, Jia Hui ; Tsai, Chien-Hung. / A peak-current controlled single-inductor dual-output DC-DC buck converter with a time-multiplexing scheme. Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010. 2010. 頁 331-334 (Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010).
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abstract = "This paper presents a peak current-controlled (PCC) single-inductor dual-output (SIDO) DC-DC buck converter with a time-multiplexing (TM) scheme. Small signal modeling, system compensation, and circuit implementation are discussed. Simulation and measurements confirm the effectiveness of the proposed method. The converter was fabricated using TSMC 0.35-μm CMOS technology. The input supply voltage is from 2.7-4.2V. Two outputs are specified at 2.5V/36mA and 1.8V/20mA, respectively, and operated at 500 KHz with a 1-μH inductor and 20-μF capacitors.",
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Chang, WH, Wang, JH & Tsai, C-H 2010, A peak-current controlled single-inductor dual-output DC-DC buck converter with a time-multiplexing scheme. 於 Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010., 5496756, Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010, 頁 331-334, 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010, Hsin Chu, Taiwan, 10-04-26. https://doi.org/10.1109/VDAT.2010.5496756

A peak-current controlled single-inductor dual-output DC-DC buck converter with a time-multiplexing scheme. / Chang, Wei Hsun; Wang, Jia Hui; Tsai, Chien-Hung.

Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010. 2010. p. 331-334 5496756 (Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010).

研究成果: Conference contribution

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Chang WH, Wang JH, Tsai C-H. A peak-current controlled single-inductor dual-output DC-DC buck converter with a time-multiplexing scheme. 於 Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010. 2010. p. 331-334. 5496756. (Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010). https://doi.org/10.1109/VDAT.2010.5496756