In this paper, a practical design for built-in current sensors (BICS’s) is proposed. This scheme can execute current testing during the normal circuit operation with very small impact on the performance of the circuit under test (CUT). In addition, scalable resolutions and no external voltage/current reference make this design more effective and efficient than previous designs. Moreover this scheme can be used to monitor the current-related faults of both CMOS and non-CMOS circuits. Thus it is highly suitable for design for testability (DFT) on a multiple-chip module (MCM) or to be the current monitor on the test fixture under the quality test action group (QTAG) standard .
|頁（從 - 到）||302-310|
|期刊||IEEE Transactions on Very Large Scale Integration (VLSI) Systems|
|出版狀態||Published - 1995 六月|
All Science Journal Classification (ASJC) codes