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A process/physics-based compact model for nonclassical CMOS device and circuit design

  • J. G. Fossum
  • , L. Ge
  • , M. H. Chiang
  • , V. P. Trivedi
  • , M. M. Chowdhury
  • , L. Mathew
  • , G. O. Workman
  • , B. Y. Nguyen

研究成果: Article同行評審

95   !!Link opens in a new tab 引文 斯高帕斯(Scopus)

摘要

A process/physics-based compact model (UFDG) for nonclassical MOSFETs having ultra-thin Si bodies (UTB) is overviewed. The model, in essence, is a compact Poisson-Schrödinger solver, including accountings for short-channel effects, and is applicable to nanoscale fully depleted (FD) SOI MOSFETs as well as generic double-gate (DG) devices. The utility of UFDG in nonclassical CMOS device design, as well as circuit design, is stressed, and demonstrated by using it in Spice3 to design UTB MOSFETs and to project extremely scaled DG and FD/SOI CMOS performances. Also, calibration of UFDG to fabricated FinFETs yields new physical insights about these potentially viable nanoscale DG devices, and about model requirements for them.

原文English
頁(從 - 到)919-926
頁數8
期刊Solid-State Electronics
48
發行號6
DOIs
出版狀態Published - 2004 6月

All Science Journal Classification (ASJC) codes

  • 電子、光磁材料
  • 凝聚態物理學
  • 材料化學
  • 電氣與電子工程

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