A prototype of a wireless-based test system

Jing Jia Liou; Chih Tsun Huang; Cheng Wen Wu; Ching Cheng Tien; Chih Hu Wang; Hsi Pin Ma; Ying Yen Chen; Yueh Chih Hsu; Li Ming Deng; Chien Jung Chiu; Young Wey Li; Chieh Ming Chang

doi:10.1109/SOCC.2007.4545463

A prototype of a wireless-based test system

Jing Jia Liou
, Chih Tsun Huang
, Cheng Wen Wu
, Ching Cheng Tien
, Chih Hu Wang
, Hsi Pin Ma
, Ying Yen Chen
, Yueh Chih Hsu
, Li Ming Deng
, Chien Jung Chiu
, Young Wey Li
, Chieh Ming Chang

電機工程學系

研究成果: Conference contribution

9 引文斯高帕斯（Scopus）

摘要

In this paper, we will describe a prototyping system to demonstrate a next-generation test configuration, which uniformly supports wafer test, final production test and field diagnosis. The implementation shows that we can reduce the test cost significantly by adapting a wireless-based test system.

原文	English
主出版物標題	Proceedings - 20th Anniversary IEEE International SOC Conference
頁面	225-228
頁數	4
DOIs	https://doi.org/10.1109/SOCC.2007.4545463
出版狀態	Published - 2007 12月 1
事件	20th Anniversary IEEE International SOC Conference - Hsinchu, Taiwan 持續時間: 2007 9月 26 → 2007 9月 29

出版系列

名字	Proceedings - 20th Anniversary IEEE International SOC Conference

Other

Other	20th Anniversary IEEE International SOC Conference
國家/地區	Taiwan
城市	Hsinchu
期間	07-09-26 → 07-09-29

All Science Journal Classification (ASJC) codes

電氣與電子工程

存取文件

10.1109/SOCC.2007.4545463

其它文件與鏈接

引用此

Liou, J. J., Huang, C. T., Wu, C. W., Tien, C. C., Wang, C. H., Ma, H. P., Chen, Y. Y., Hsu, Y. C., Deng, L. M., Chiu, C. J., Li, Y. W., & Chang, C. M. (2007). A prototype of a wireless-based test system. 於 Proceedings - 20th Anniversary IEEE International SOC Conference (頁 225-228). 文章 4545463 (Proceedings - 20th Anniversary IEEE International SOC Conference). https://doi.org/10.1109/SOCC.2007.4545463

@inproceedings{b4ece68ce62742c68d57d06cfc642d45,

title = "A prototype of a wireless-based test system",

abstract = "In this paper, we will describe a prototyping system to demonstrate a next-generation test configuration, which uniformly supports wafer test, final production test and field diagnosis. The implementation shows that we can reduce the test cost significantly by adapting a wireless-based test system.",

author = "Liou, \{Jing Jia\} and Huang, \{Chih Tsun\} and Wu, \{Cheng Wen\} and Tien, \{Ching Cheng\} and Wang, \{Chih Hu\} and Ma, \{Hsi Pin\} and Chen, \{Ying Yen\} and Hsu, \{Yueh Chih\} and Deng, \{Li Ming\} and Chiu, \{Chien Jung\} and Li, \{Young Wey\} and Chang, \{Chieh Ming\}",

year = "2007",

month = dec,

day = "1",

doi = "10.1109/SOCC.2007.4545463",

language = "English",

isbn = "9781424415922",

series = "Proceedings - 20th Anniversary IEEE International SOC Conference",

pages = "225--228",

booktitle = "Proceedings - 20th Anniversary IEEE International SOC Conference",

note = "20th Anniversary IEEE International SOC Conference ; Conference date: 26-09-2007 Through 29-09-2007",

}

Liou, JJ, Huang, CT, Wu, CW, Tien, CC, Wang, CH, Ma, HP, Chen, YY, Hsu, YC, Deng, LM, Chiu, CJ, Li, YW & Chang, CM 2007, A prototype of a wireless-based test system. 於 Proceedings - 20th Anniversary IEEE International SOC Conference., 4545463, Proceedings - 20th Anniversary IEEE International SOC Conference, 頁 225-228, 20th Anniversary IEEE International SOC Conference, Hsinchu, Taiwan, 07-09-26. https://doi.org/10.1109/SOCC.2007.4545463

TY - GEN

T1 - A prototype of a wireless-based test system

AU - Liou, Jing Jia

AU - Huang, Chih Tsun

AU - Wu, Cheng Wen

AU - Tien, Ching Cheng

AU - Wang, Chih Hu

AU - Ma, Hsi Pin

AU - Chen, Ying Yen

AU - Hsu, Yueh Chih

AU - Deng, Li Ming

AU - Chiu, Chien Jung

AU - Li, Young Wey

AU - Chang, Chieh Ming

PY - 2007/12/1

Y1 - 2007/12/1

N2 - In this paper, we will describe a prototyping system to demonstrate a next-generation test configuration, which uniformly supports wafer test, final production test and field diagnosis. The implementation shows that we can reduce the test cost significantly by adapting a wireless-based test system.

AB - In this paper, we will describe a prototyping system to demonstrate a next-generation test configuration, which uniformly supports wafer test, final production test and field diagnosis. The implementation shows that we can reduce the test cost significantly by adapting a wireless-based test system.

UR - https://www.scopus.com/pages/publications/51049116812

UR - https://www.scopus.com/pages/publications/51049116812#tab=citedBy

U2 - 10.1109/SOCC.2007.4545463

DO - 10.1109/SOCC.2007.4545463

M3 - Conference contribution

AN - SCOPUS:51049116812

SN - 9781424415922

T3 - Proceedings - 20th Anniversary IEEE International SOC Conference

SP - 225

EP - 228

BT - Proceedings - 20th Anniversary IEEE International SOC Conference

T2 - 20th Anniversary IEEE International SOC Conference

Y2 - 26 September 2007 through 29 September 2007

ER -

A prototype of a wireless-based test system

摘要

出版系列

Other

All Science Journal Classification (ASJC) codes

存取文件

其它文件與鏈接

指紋

引用此