TY - GEN
T1 - A reliable delay-based physical unclonable function with dark-bit avoidance
AU - Chiou, Lih Yih
AU - Wu, Chung Han
AU - Wei, Po Cheng
N1 - Funding Information:
ACKNOWLEDGEMENT The author would like to thank Taiwan Ministry of Science and Technology (MOST 107-2634-F-006-002 – and 107-2218-E-006-026-) and Taiwan Semiconductor Research Institute(TSRI) for their supports in grants and facilities for design, fabrication and measurement respectively.
Publisher Copyright:
© 2019 IEEE
PY - 2019
Y1 - 2019
N2 - With a large number of networked devices deployed in the internet of things (IoT), secure communication has become one of the major concerns. A physical unclonable function (PUF) can provide every chip with a unique fingerprint that is difficult for attackers to hack. Furthermore, the PUF provides a light-weight key generator to enhance the IoT security. In this paper, we present a reliable and highly energy efficient PUF with a dark-bit avoidance mechanism to mitigate reliability issues. The measurement results demonstrate that, when compared with several other designs, the proposed design has a smaller area per bit, a lower bit error rate and higher energy efficiency.
AB - With a large number of networked devices deployed in the internet of things (IoT), secure communication has become one of the major concerns. A physical unclonable function (PUF) can provide every chip with a unique fingerprint that is difficult for attackers to hack. Furthermore, the PUF provides a light-weight key generator to enhance the IoT security. In this paper, we present a reliable and highly energy efficient PUF with a dark-bit avoidance mechanism to mitigate reliability issues. The measurement results demonstrate that, when compared with several other designs, the proposed design has a smaller area per bit, a lower bit error rate and higher energy efficiency.
UR - http://www.scopus.com/inward/record.url?scp=85066809583&partnerID=8YFLogxK
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U2 - 10.1109/ISCAS.2019.8702131
DO - 10.1109/ISCAS.2019.8702131
M3 - Conference contribution
AN - SCOPUS:85066809583
T3 - Proceedings - IEEE International Symposium on Circuits and Systems
BT - 2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019
Y2 - 26 May 2019 through 29 May 2019
ER -