A Reliable Near-Threshold Voltage SRAM-Based PUF Utilizing Weight Detection Technique

Lih Yih Chiou, Jing Yu Huang, Chi Kuan Li, Chen Chung Tsai

研究成果: Conference contribution

摘要

With the continuous advancement of technology, security issues have become increasingly important. In the applications of Internet of Things (IoT), millions of IoT devices are designed to collect data that are sensitive or private. It is crucial to secure such devices. Therefore, every vulnerable device needs to be protected during either communication or operation. Physical unclonable function (PUF), which utilizes random variation during the chip manufacturing process, can realize the concept of chip fingerprint. A PUF not only enhances security but also provides a lightweight choice different from the traditional mechanism that requires a huge amount of storage. In this paper, a reliable near-threshold voltage SRAM-based PUF is designed and presented. The proposed near-threshold design not only achieves 98.055% reliability and 49.99% uniqueness but also consumes lower energy when compared with other works.

原文English
主出版物標題2021 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2021 - Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781665419154
DOIs
出版狀態Published - 2021 四月 19
事件2021 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2021 - Hsinchu, Taiwan
持續時間: 2021 四月 192021 四月 22

出版系列

名字2021 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2021 - Proceedings

Conference

Conference2021 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2021
國家/地區Taiwan
城市Hsinchu
期間21-04-1921-04-22

All Science Journal Classification (ASJC) codes

  • 硬體和架構
  • 安全、風險、可靠性和品質
  • 儀器
  • 電氣與電子工程

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