TY - JOUR
T1 - A review of statistical methods for quality improvement and control in nanotechnology
AU - Lu, Jye Chyi
AU - Jeng, Shuen Lin
AU - Wang, Kaibo
PY - 2009/4
Y1 - 2009/4
N2 - Nanotechnology has received a considerable amount of attention from various fields and has become a multidisciplinary subject, where several research ventures have taken place in recent years. This field is expected to affect every sector of our economy and daily life in the near future. Besides advances in physics, chemistry, biology, and other science-based technologies, the use of statistical methods has also helped the rapid development of nanotechnology in terms of data collection, treatment-effect estimation, hypothesis testing, and quality control. This paper reviews some instances where statistical methods have been used in nanoscale applications. Topics include experimental design, uncertainty modeling, process optimization and monitoring, and areas for future research efforts.
AB - Nanotechnology has received a considerable amount of attention from various fields and has become a multidisciplinary subject, where several research ventures have taken place in recent years. This field is expected to affect every sector of our economy and daily life in the near future. Besides advances in physics, chemistry, biology, and other science-based technologies, the use of statistical methods has also helped the rapid development of nanotechnology in terms of data collection, treatment-effect estimation, hypothesis testing, and quality control. This paper reviews some instances where statistical methods have been used in nanoscale applications. Topics include experimental design, uncertainty modeling, process optimization and monitoring, and areas for future research efforts.
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U2 - 10.1080/00224065.2009.11917770
DO - 10.1080/00224065.2009.11917770
M3 - Review article
AN - SCOPUS:64549128226
SN - 0022-4065
VL - 41
SP - 148
EP - 164
JO - Journal of Quality Technology
JF - Journal of Quality Technology
IS - 2
ER -