A review of statistical methods for quality improvement and control in nanotechnology

Jye Chyi Lu, Shuen Lin Jeng, Kaibo Wang

研究成果: Review article

28 引文 斯高帕斯(Scopus)

摘要

Nanotechnology has received a considerable amount of attention from various fields and has become a multidisciplinary subject, where several research ventures have taken place in recent years. This field is expected to affect every sector of our economy and daily life in the near future. Besides advances in physics, chemistry, biology, and other science-based technologies, the use of statistical methods has also helped the rapid development of nanotechnology in terms of data collection, treatment-effect estimation, hypothesis testing, and quality control. This paper reviews some instances where statistical methods have been used in nanoscale applications. Topics include experimental design, uncertainty modeling, process optimization and monitoring, and areas for future research efforts.

原文English
頁(從 - 到)148-164
頁數17
期刊Journal of Quality Technology
41
發行號2
DOIs
出版狀態Published - 2009 四月

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality
  • Strategy and Management
  • Management Science and Operations Research
  • Industrial and Manufacturing Engineering

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