A-Si:H gate driver circuit for in-cell touch panels driven by multi-V blanking method

Mao Hsun Cheng, Chin Hsien Tseng, Ching En Lee, Chih Lung Lin

研究成果: Conference contribution

摘要

A gate driver circuit for in-cell touch panels to avoid the thin-film transistor stress problem is presented. An 85 °C TFT model is developed and HSPICE verifies the functionality of the circuit. Simulation shows the maximum deviation of transition times is only 0.65%.

原文English
主出版物標題23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016
發行者Society for Information Display
頁面2238-2239
頁數2
ISBN(電子)9781510845510
出版狀態Published - 2018
事件23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016 - Fukuoka, Japan
持續時間: 2016 十二月 72016 十二月 9

出版系列

名字23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016
4

Other

Other23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016
國家Japan
城市Fukuoka
期間16-12-0716-12-09

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Human-Computer Interaction
  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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