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A steep subthreshold swing technique for gate-all-around SOI MOSFETs

研究成果: Conference contribution

摘要

A device design technique for silicon nanowire MOSFETs for low power capability beyond 10 nm technology node is demonstrated using 3D numerical simulation and physical analysis. The subthreshold kink effect enables the use of low supply bias without compromising performance. The kink-assisted methodology overcomes the fundamental and thermal voltage-limited subthreshold swing (SS).

原文English
主出版物標題Advanced CMOS-Compatible Semiconductor Devices 17
編輯Y. Omura, J. A. Martino, J. P. Raskin, S. Selberherr, H. Ishii, F. Gamiz, B. Y. Nguyen
發行者Electrochemical Society Inc.
頁面87-92
頁數6
版本5
ISBN(電子)9781607685951
DOIs
出版狀態Published - 2015
事件Symposium on Advanced CMOS-Compatible Semiconductor Devices 17 - 227th ECS Meeting - Chicago, United States
持續時間: 2015 5月 242015 5月 28

出版系列

名字ECS Transactions
號碼5
66
ISSN(列印)1938-6737
ISSN(電子)1938-5862

Other

OtherSymposium on Advanced CMOS-Compatible Semiconductor Devices 17 - 227th ECS Meeting
國家/地區United States
城市Chicago
期間15-05-2415-05-28

All Science Journal Classification (ASJC) codes

  • 一般工程

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