A Study of Underfill Dispensing Patterns in Flip-Chip Packaging

Dao Long Chen, Hui Jing Chang, Tang Yuan Chen, Yung Hsiang Hu, Ting Bin Chen, Chi Hung Pan, Yu Shuo Yang, Sheng Jye Hwang

研究成果: Conference contribution

1 引文 斯高帕斯(Scopus)

摘要

In view of the continuous growth of digital-twin in the technology and industry in recent years, this study conducted the digital mapping of the underfill dispensing process through experiment and simulation to understand and solve the void problem that frequently occurred in flip-chip packaging.

原文English
主出版物標題2023 International Conference on Electronics Packaging, ICEP 2023
發行者Institute of Electrical and Electronics Engineers Inc.
頁面115-116
頁數2
ISBN(電子)9784991191152
DOIs
出版狀態Published - 2023
事件22nd International Conference on Electronics Packaging, ICEP 2023 - Kumamoto, Japan
持續時間: 2023 4月 192023 4月 22

出版系列

名字2023 International Conference on Electronics Packaging, ICEP 2023

Conference

Conference22nd International Conference on Electronics Packaging, ICEP 2023
國家/地區Japan
城市Kumamoto
期間23-04-1923-04-22

All Science Journal Classification (ASJC) codes

  • 電氣與電子工程
  • 工業與製造工程
  • 材料力學
  • 安全、風險、可靠性和品質
  • 電子、光磁材料

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