A systematic method to classify scan cells

K. J. Lee, M. H. Lu, J. F. Wang

研究成果: Conference contribution

5 引文 斯高帕斯(Scopus)

摘要

A scan cell (S-cell) is a basic storage unit for a scan-based sequential circuit. Depending on different requirements on the circuit under test, many design variations of S-cells exist. In this paper a systematic method to classify all practical S-cells is presented. Based on a novel graph representation and a set of design criteria, we find that all practical S-cells can be classified into 19 schematic structures which can be further divided into 66 different substructures. Among all of these substructures less than 10 have been previously identified and used.

原文English
主出版物標題ATS 1993 Proceedings - 2nd Asian Test Symposium
發行者IEEE Computer Society
頁面219-224
頁數6
ISBN(電子)081863930X
DOIs
出版狀態Published - 1993 一月 1
事件2nd IEEE Asian Test Symposium, ATS 1993 - Beijing, China
持續時間: 1993 十一月 161993 十一月 18

出版系列

名字Proceedings of the Asian Test Symposium
ISSN(列印)1081-7735

Conference

Conference2nd IEEE Asian Test Symposium, ATS 1993
國家/地區China
城市Beijing
期間93-11-1693-11-18

All Science Journal Classification (ASJC) codes

  • 電氣與電子工程

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