A test access control and test integration system for system-on-chip

Cheng-Wen Wu, C.-W. Wang, J.-R. Huang, K.-L. Cheng, H.-S. Hsu, C.-T. Huang, Y.-L. Lin

研究成果: Conference contribution

原文English
主出版物標題6th IEEE Int. Workshop on Testing Embedded Core-Based System-Chips (TECS)
出版地Monterey, California
出版狀態Published - 2002 五月

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