A test access control and test integration system for system-on-chip

Cheng-Wen Wu, C.-W. Wang, J.-R. Huang, K.-L. Cheng, H.-S. Hsu, C.-T. Huang, Y.-L. Lin

研究成果: Conference contribution

原文English
主出版物標題6th IEEE Int. Workshop on Testing Embedded Core-Based System-Chips (TECS)
出版地Monterey, California
出版狀態Published - 2002 五月

引用此

Wu, C-W., Wang, C-W., Huang, J-R., Cheng, K-L., Hsu, H-S., Huang, C-T., & Lin, Y-L. (2002). A test access control and test integration system for system-on-chip. 於 6th IEEE Int. Workshop on Testing Embedded Core-Based System-Chips (TECS)