A test controller for system-on-chip designs with test wrappers

Cheng-Wen Wu, J.-B. Chen, J.-F. Li, H.-J. Huang, C.-P. Su, C. Cheng, S.-I Chen, C.-Y. Hwang, H.-P. Lin

研究成果: Conference contribution

原文English
主出版物標題12th VLSI Design/CAD Symposium
出版地Hsinchu
出版狀態Published - 2001 八月

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