A test program generator for memory systems

Hung Ju Shih, Jar Shone Ker, Yau Hwang Kuo

研究成果: Article同行評審

摘要

A set of algorithms which can be used to detect and locate the faults in a given memory system, and a test program generator which automatically produces test programs according to the algorithms which are used by the memory system to be tested are developed. Furthermore, a fault simulator designed to simulate the faulty behavior of a memory system has been developed to evaluate the effectiveness of the test program in covering faults. Results showed that a fault coverage near 100% could be achieved.

All Science Journal Classification (ASJC) codes

  • 工程 (全部)

指紋

深入研究「A test program generator for memory systems」主題。共同形成了獨特的指紋。

引用此