Accelerated life tests for weibull series systems with masked data

Tsai Hung Fan, Wan Lun Wang

研究成果: Article同行評審

41 引文 斯高帕斯(Scopus)

摘要

This article introduces a p-stage step-stress accelerated life test on n system products, where each system contains m s-independent non-identical components connected in series, and it fails if any component has broken down. Due to cost considerations or environmental restrictions, masked causes of system failures and type-I censored observations might occur in the collected data. The time to failure under a pre-specified stress environment is described by a Weibull-distributed cumulative exposure model. A computationally feasible procedure based on the hybrid EM-NR algorithm is developed for maximum likelihood estimation of the model. Further, the reliability of the system and components are estimated at a specified time under usual operating conditions. The proposed method is illustrated through a numerical example and a simulation study under various masking levels.

原文English
文章編號5753980
頁(從 - 到)557-569
頁數13
期刊IEEE Transactions on Reliability
60
發行號3
DOIs
出版狀態Published - 2011 9月

All Science Journal Classification (ASJC) codes

  • 安全、風險、可靠性和品質
  • 電氣與電子工程

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