In this paper we present the accelerated reliability testing of MgZnO based UV detectors. The UV detectors are fabricated on glass, quartz and sapphire substrates by Pulsed Laser Deposition (PLD) technique. The films are highly oriented and show sharp transmission at 350nm and 330nm for Mg composition of 10% and 20% in ZnO, respectively. The device response has been studied and life expectancy of the devices has been estimated from the accelerated tests.
|頁（從 - 到）||495-499|
|期刊||Materials Research Society Symposium - Proceedings|
|出版狀態||Published - 2003|
|事件||Materials and Devices for Smart Systems - Boston, MA, United States|
持續時間: 2003 12月 1 → 2003 12月 5
All Science Journal Classification (ASJC) codes