Accelerated reliability test inputs in analyzing the device response of MgZnO based UV detector

S. S. Hullavarad, I. Takeuchi, J. Berger, S. Dhar, K. S. Chang, T. Venkatesan, T. C. Loughran, R. D. Vispute, S. N. Yedave

研究成果: Conference article同行評審

1 引文 斯高帕斯(Scopus)

摘要

In this paper we present the accelerated reliability testing of MgZnO based UV detectors. The UV detectors are fabricated on glass, quartz and sapphire substrates by Pulsed Laser Deposition (PLD) technique. The films are highly oriented and show sharp transmission at 350nm and 330nm for Mg composition of 10% and 20% in ZnO, respectively. The device response has been studied and life expectancy of the devices has been estimated from the accelerated tests.

原文English
頁(從 - 到)495-499
頁數5
期刊Materials Research Society Symposium - Proceedings
785
DOIs
出版狀態Published - 2003
事件Materials and Devices for Smart Systems - Boston, MA, United States
持續時間: 2003 12月 12003 12月 5

All Science Journal Classification (ASJC) codes

  • 材料科學(全部)
  • 凝聚態物理學
  • 材料力學
  • 機械工業

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