Accumulator-based output selection for test response compaction

Wei Cheng Lien, Kuen-Jong Lee, Tong Yu Hsieh, Shih Shiun Chien, Krishnendu Chakrabarty

研究成果: Paper同行評審

1 引文 斯高帕斯(Scopus)


Output selection is a recently proposed test response compaction method, where only a subset of output response bits is selected for observation. It can achieve zero aliasing, full X-tolerance, and high diagnosability. We propose an output selection scheme for multiple scan designs, which employs only accumulators and multiplexers, and thus involves small area overhead and simple test control. An efficient selection procedure is presented to determine a minimal test set and the corresponding output bits to select for complete fault coverage. Experimental results show that when only one accumulator and one multiplexer are employed, 100% single stuck-at fault coverage for ISCAS'89 (ITC'99) circuits can be achieved by observing only 9.84% (8.19%) of the test response bits with only 1.86% (1.18%) area overhead.

出版狀態Published - 2012 9月 28
事件2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012 - Seoul, Korea, Republic of
持續時間: 2012 5月 202012 5月 23


Other2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012
國家/地區Korea, Republic of

All Science Journal Classification (ASJC) codes

  • 硬體和架構
  • 電氣與電子工程


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