摘要
Output selection is a recently proposed test response compaction method, where only a subset of output response bits is selected for observation. It can achieve zero aliasing, full X-tolerance, and high diagnosability. We propose an output selection scheme for multiple scan designs, which employs only accumulators and multiplexers, and thus involves small area overhead and simple test control. An efficient selection procedure is presented to determine a minimal test set and the corresponding output bits to select for complete fault coverage. Experimental results show that when only one accumulator and one multiplexer are employed, 100% single stuck-at fault coverage for ISCAS'89 (ITC'99) circuits can be achieved by observing only 9.84% (8.19%) of the test response bits with only 1.86% (1.18%) area overhead.
| 原文 | English |
|---|---|
| 頁面 | 2313-2316 |
| 頁數 | 4 |
| DOIs | |
| 出版狀態 | Published - 2012 九月 28 |
| 事件 | 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012 - Seoul, Korea, Republic of 持續時間: 2012 五月 20 → 2012 五月 23 |
Other
| Other | 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012 |
|---|---|
| 國家 | Korea, Republic of |
| 城市 | Seoul |
| 期間 | 12-05-20 → 12-05-23 |
指紋
All Science Journal Classification (ASJC) codes
- Hardware and Architecture
- Electrical and Electronic Engineering
引用此文
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Accumulator-based output selection for test response compaction. / Lien, Wei Cheng; Lee, Kuen-Jong; Hsieh, Tong Yu; Chien, Shih Shiun; Chakrabarty, Krishnendu.
2012. 2313-2316 論文發表於 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea, Republic of.研究成果: Paper
TY - CONF
T1 - Accumulator-based output selection for test response compaction
AU - Lien, Wei Cheng
AU - Lee, Kuen-Jong
AU - Hsieh, Tong Yu
AU - Chien, Shih Shiun
AU - Chakrabarty, Krishnendu
PY - 2012/9/28
Y1 - 2012/9/28
N2 - Output selection is a recently proposed test response compaction method, where only a subset of output response bits is selected for observation. It can achieve zero aliasing, full X-tolerance, and high diagnosability. We propose an output selection scheme for multiple scan designs, which employs only accumulators and multiplexers, and thus involves small area overhead and simple test control. An efficient selection procedure is presented to determine a minimal test set and the corresponding output bits to select for complete fault coverage. Experimental results show that when only one accumulator and one multiplexer are employed, 100% single stuck-at fault coverage for ISCAS'89 (ITC'99) circuits can be achieved by observing only 9.84% (8.19%) of the test response bits with only 1.86% (1.18%) area overhead.
AB - Output selection is a recently proposed test response compaction method, where only a subset of output response bits is selected for observation. It can achieve zero aliasing, full X-tolerance, and high diagnosability. We propose an output selection scheme for multiple scan designs, which employs only accumulators and multiplexers, and thus involves small area overhead and simple test control. An efficient selection procedure is presented to determine a minimal test set and the corresponding output bits to select for complete fault coverage. Experimental results show that when only one accumulator and one multiplexer are employed, 100% single stuck-at fault coverage for ISCAS'89 (ITC'99) circuits can be achieved by observing only 9.84% (8.19%) of the test response bits with only 1.86% (1.18%) area overhead.
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UR - http://www.scopus.com/inward/citedby.url?scp=84866615993&partnerID=8YFLogxK
U2 - 10.1109/ISCAS.2012.6271757
DO - 10.1109/ISCAS.2012.6271757
M3 - Paper
AN - SCOPUS:84866615993
SP - 2313
EP - 2316
ER -