Accumulator-based output selection for test response compaction

Wei Cheng Lien, Kuen-Jong Lee, Tong Yu Hsieh, Shih Shiun Chien, Krishnendu Chakrabarty

研究成果: Paper

1 引文 (Scopus)

摘要

Output selection is a recently proposed test response compaction method, where only a subset of output response bits is selected for observation. It can achieve zero aliasing, full X-tolerance, and high diagnosability. We propose an output selection scheme for multiple scan designs, which employs only accumulators and multiplexers, and thus involves small area overhead and simple test control. An efficient selection procedure is presented to determine a minimal test set and the corresponding output bits to select for complete fault coverage. Experimental results show that when only one accumulator and one multiplexer are employed, 100% single stuck-at fault coverage for ISCAS'89 (ITC'99) circuits can be achieved by observing only 9.84% (8.19%) of the test response bits with only 1.86% (1.18%) area overhead.

原文English
頁面2313-2316
頁數4
DOIs
出版狀態Published - 2012 九月 28
事件2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012 - Seoul, Korea, Republic of
持續時間: 2012 五月 202012 五月 23

Other

Other2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012
國家Korea, Republic of
城市Seoul
期間12-05-2012-05-23

指紋

Compaction
Networks (circuits)

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

引用此文

Lien, W. C., Lee, K-J., Hsieh, T. Y., Chien, S. S., & Chakrabarty, K. (2012). Accumulator-based output selection for test response compaction. 2313-2316. 論文發表於 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea, Republic of. https://doi.org/10.1109/ISCAS.2012.6271757
Lien, Wei Cheng ; Lee, Kuen-Jong ; Hsieh, Tong Yu ; Chien, Shih Shiun ; Chakrabarty, Krishnendu. / Accumulator-based output selection for test response compaction. 論文發表於 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea, Republic of.4 p.
@conference{8c97c2d1c9a0476b8e03e957e418ae65,
title = "Accumulator-based output selection for test response compaction",
abstract = "Output selection is a recently proposed test response compaction method, where only a subset of output response bits is selected for observation. It can achieve zero aliasing, full X-tolerance, and high diagnosability. We propose an output selection scheme for multiple scan designs, which employs only accumulators and multiplexers, and thus involves small area overhead and simple test control. An efficient selection procedure is presented to determine a minimal test set and the corresponding output bits to select for complete fault coverage. Experimental results show that when only one accumulator and one multiplexer are employed, 100{\%} single stuck-at fault coverage for ISCAS'89 (ITC'99) circuits can be achieved by observing only 9.84{\%} (8.19{\%}) of the test response bits with only 1.86{\%} (1.18{\%}) area overhead.",
author = "Lien, {Wei Cheng} and Kuen-Jong Lee and Hsieh, {Tong Yu} and Chien, {Shih Shiun} and Krishnendu Chakrabarty",
year = "2012",
month = "9",
day = "28",
doi = "10.1109/ISCAS.2012.6271757",
language = "English",
pages = "2313--2316",
note = "2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012 ; Conference date: 20-05-2012 Through 23-05-2012",

}

Lien, WC, Lee, K-J, Hsieh, TY, Chien, SS & Chakrabarty, K 2012, 'Accumulator-based output selection for test response compaction' 論文發表於 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea, Republic of, 12-05-20 - 12-05-23, 頁 2313-2316. https://doi.org/10.1109/ISCAS.2012.6271757

Accumulator-based output selection for test response compaction. / Lien, Wei Cheng; Lee, Kuen-Jong; Hsieh, Tong Yu; Chien, Shih Shiun; Chakrabarty, Krishnendu.

2012. 2313-2316 論文發表於 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea, Republic of.

研究成果: Paper

TY - CONF

T1 - Accumulator-based output selection for test response compaction

AU - Lien, Wei Cheng

AU - Lee, Kuen-Jong

AU - Hsieh, Tong Yu

AU - Chien, Shih Shiun

AU - Chakrabarty, Krishnendu

PY - 2012/9/28

Y1 - 2012/9/28

N2 - Output selection is a recently proposed test response compaction method, where only a subset of output response bits is selected for observation. It can achieve zero aliasing, full X-tolerance, and high diagnosability. We propose an output selection scheme for multiple scan designs, which employs only accumulators and multiplexers, and thus involves small area overhead and simple test control. An efficient selection procedure is presented to determine a minimal test set and the corresponding output bits to select for complete fault coverage. Experimental results show that when only one accumulator and one multiplexer are employed, 100% single stuck-at fault coverage for ISCAS'89 (ITC'99) circuits can be achieved by observing only 9.84% (8.19%) of the test response bits with only 1.86% (1.18%) area overhead.

AB - Output selection is a recently proposed test response compaction method, where only a subset of output response bits is selected for observation. It can achieve zero aliasing, full X-tolerance, and high diagnosability. We propose an output selection scheme for multiple scan designs, which employs only accumulators and multiplexers, and thus involves small area overhead and simple test control. An efficient selection procedure is presented to determine a minimal test set and the corresponding output bits to select for complete fault coverage. Experimental results show that when only one accumulator and one multiplexer are employed, 100% single stuck-at fault coverage for ISCAS'89 (ITC'99) circuits can be achieved by observing only 9.84% (8.19%) of the test response bits with only 1.86% (1.18%) area overhead.

UR - http://www.scopus.com/inward/record.url?scp=84866615993&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84866615993&partnerID=8YFLogxK

U2 - 10.1109/ISCAS.2012.6271757

DO - 10.1109/ISCAS.2012.6271757

M3 - Paper

AN - SCOPUS:84866615993

SP - 2313

EP - 2316

ER -

Lien WC, Lee K-J, Hsieh TY, Chien SS, Chakrabarty K. Accumulator-based output selection for test response compaction. 2012. 論文發表於 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea, Republic of. https://doi.org/10.1109/ISCAS.2012.6271757