Accumulator-based output selection for test response compaction

Wei Cheng Lien, Kuen-Jong Lee, Tong Yu Hsieh, Shih Shiun Chien, Krishnendu Chakrabarty

研究成果: Paper同行評審

1 引文 斯高帕斯(Scopus)

摘要

Output selection is a recently proposed test response compaction method, where only a subset of output response bits is selected for observation. It can achieve zero aliasing, full X-tolerance, and high diagnosability. We propose an output selection scheme for multiple scan designs, which employs only accumulators and multiplexers, and thus involves small area overhead and simple test control. An efficient selection procedure is presented to determine a minimal test set and the corresponding output bits to select for complete fault coverage. Experimental results show that when only one accumulator and one multiplexer are employed, 100% single stuck-at fault coverage for ISCAS'89 (ITC'99) circuits can be achieved by observing only 9.84% (8.19%) of the test response bits with only 1.86% (1.18%) area overhead.

原文English
頁面2313-2316
頁數4
DOIs
出版狀態Published - 2012 九月 28
事件2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012 - Seoul, Korea, Republic of
持續時間: 2012 五月 202012 五月 23

Other

Other2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012
國家Korea, Republic of
城市Seoul
期間12-05-2012-05-23

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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