Acoustic spectroscopy for studies of vitreous silica up to 740 GHz

Kung Hsuan Lin, Dzung Han Tsai, Kuan Jen Wang, Sheng Hui Chen, Kai Lun Chi, Jin Wei Shi, Po Cheng Chen, Jinn Kong Sheu

研究成果: Article

7 引文 斯高帕斯(Scopus)

摘要

Due to the high attenuation in vitreous silica, acoustic attenuations in the THz regime are typically measured by incoherent techniques such as Raman, neutron, and X-ray scattering. Here, we utilized multiple-quantum-well structures to demonstrate acoustic spectroscopy of vitreous silica up to ∼740 THz. The acoustic properties of silica thin films prepared by physical and chemical deposition methods were characterized in the sub-THz regime. This technique can be useful in resolving debated issues relating to Boson peak around 1 THz.

原文English
文章編號072126
期刊AIP Advances
3
發行號7
DOIs
出版狀態Published - 2013 八月 26

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

指紋 深入研究「Acoustic spectroscopy for studies of vitreous silica up to 740 GHz」主題。共同形成了獨特的指紋。

  • 引用此

    Lin, K. H., Tsai, D. H., Wang, K. J., Chen, S. H., Chi, K. L., Shi, J. W., Chen, P. C., & Sheu, J. K. (2013). Acoustic spectroscopy for studies of vitreous silica up to 740 GHz. AIP Advances, 3(7), [072126]. https://doi.org/10.1063/1.4816800