Admittance spectroscopy in CZTSSe: Metastability behavior and voltage dependent defect study

Mark J. Koeper, Charles J. Hages, Jian V. Li, Dean Levi, Rakesh Agrawal

研究成果: Conference contribution

摘要

Admittance spectroscopy has been performed on a CZTSSe device with a carrier injection pretreatment and under electronically relaxed conditions to demonstrate metastability behavior. We show that the measurements with the carrier injection pretreatment demonstrate two admittance signatures while the relaxed measurement demonstrates only one admittance signature with a different activation energy. Additionally, voltage dependent admittance spectroscopy was performed using the carrier injection pretreatment method at each of the applied voltage bias. The activation energies of the two admittance signatures were calculated and are shown to be independent of the voltage bias.

原文English
主出版物標題2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
發行者Institute of Electrical and Electronics Engineers Inc.
頁面206-209
頁數4
ISBN(電子)9781509056057
DOIs
出版狀態Published - 2017
事件44th IEEE Photovoltaic Specialist Conference, PVSC 2017 - Washington, United States
持續時間: 2017 6月 252017 6月 30

出版系列

名字2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017

Other

Other44th IEEE Photovoltaic Specialist Conference, PVSC 2017
國家/地區United States
城市Washington
期間17-06-2517-06-30

All Science Journal Classification (ASJC) codes

  • 可再生能源、永續發展與環境
  • 電氣與電子工程
  • 電子、光磁材料

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