Aggressively scaled strained silicon directly on insulator (SSDOI) FinFETs

A. Khakifirooz, R. Sreenivasan, B. N. Taber, F. Allibert, P. Hashemi, W. Chern, N. Xu, E. C. Wall, S. Mochizuki, J. Li, Y. Yin, N. Loubet, A. Reznicek, S. M. Mignot, D. Lu, H. He, T. Yamashita, P. Morin, G. Tsutsui, C. Y. ChenV. S. Basker, T. E. Standaert, K. Cheng, T. Levin, B. Y. Nguyen, T. S.King Liu, D. Guo, H. Bu, K. Rim, B. Doris

研究成果: Conference contribution

10 引文 斯高帕斯(Scopus)
原文English
主出版物標題2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, S3S 2013
發行者IEEE Computer Society
ISBN(列印)9781479913602
DOIs
出版狀態Published - 2013 一月 1
事件2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, S3S 2013 - Monterey, CA, United States
持續時間: 2013 十月 72013 十月 10

出版系列

名字2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, S3S 2013

Other

Other2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, S3S 2013
國家United States
城市Monterey, CA
期間13-10-0713-10-10

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

引用此