摘要
An efficient and low cost approach for depositing uniform silicon dioxide layers on GaN by liquid phase deposition (LPD) that is near room temperature will be described. The self-align and self-passivation process of LPD can ease the device fabrication. AlGaN/GaN metal oxide semiconductor heterostructure field effect transistors (MOSHFETs) with liquid phase deposited SiO2 as the insulating gate are demonstrated. Comparison between the AlGaN/GaN MOSHFETs and heterostructure field effect transistors (HFETs) will be made. Lower leakage currents, larger gate swing voltages and flatter transconductance ranges can be seen in MOSHFETs.
| 原文 | English |
|---|---|
| 頁(從 - 到) | 94-96 |
| 頁數 | 3 |
| 期刊 | Physica Scripta T |
| 卷 | T114 |
| DOIs | |
| 出版狀態 | Published - 2004 |
| 事件 | 20th Nordic Semiconductor Meeting, NSM20 - Tampere, Finland 持續時間: 2003 8月 25 → 2003 8月 27 |
All Science Journal Classification (ASJC) codes
- 一般物理與天文學
指紋
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