Al0.3Ga0.7N/GaN undoped channel heterostructure field effect transistor with Fmax of 107 GHz

R. Li, J. Cai, L. Wong, Y. Chen, K. L. Wang, R. P. Smith, S. C. Martin, K. S. Boutros, J. M. Redwing

研究成果: Article同行評審

68 引文 斯高帕斯(Scopus)

摘要

An Al0.3Ga0.7N/GaN heterostructure field effect transistor (HFET) grown on semi-insulating SiC with an 0.2-μm gate length is reported. A source-drain ohmic contact resistance of 0.15-Ω-mm was achieved through the use of high Al content and high n-type doping (1E19 cm-3) in the AlGaN donor layer and optimized metallization procedures. We obtained a maximum transconductance of 260 mS/mm, a saturated current density of 1.2 A/mm, and a maximum oscillation frequency in excess of 107 GHz in the devices. The results are one of the best achieved up to now, and they will open up the potential for the applications of AlGaN/GaN HFET's in high-power microwave radar, remote sensing, and communications.

原文English
頁(從 - 到)323-325
頁數3
期刊IEEE Electron Device Letters
20
發行號7
DOIs
出版狀態Published - 1999 7月

All Science Journal Classification (ASJC) codes

  • 電子、光磁材料
  • 電氣與電子工程

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