摘要
Scheduling for wafer fabrication of advanced technology nodes entails complicated constraints such as limited waiting times. Focusing on real settings, this paper aims to develop a novel genetic algorithm of multi-subpopulation parameters with hybrid estimation of distribution (MSPHEDA) to solve the present problem effectively and efficiently. To estimate the validity of this approach, ten scenarios were simulated on the basis of empirical data as the basis to compare the performance of MSPHEDA and other heuristic methods for minimizing makespan and reducing the total exceeded limited waiting time. The results have shown practical viability of the proposed approach.
| 原文 | English |
|---|---|
| 文章編號 | 7114308 |
| 頁(從 - 到) | 353-366 |
| 頁數 | 14 |
| 期刊 | IEEE Transactions on Semiconductor Manufacturing |
| 卷 | 28 |
| 發行號 | 3 |
| DOIs | |
| 出版狀態 | Published - 2015 8月 1 |
UN SDG
此研究成果有助於以下永續發展目標
-
SDG 9 產業、創新與基礎設施
All Science Journal Classification (ASJC) codes
- 電子、光磁材料
- 凝聚態物理學
- 工業與製造工程
- 電氣與電子工程
指紋
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