An e-diagnostics framework with security considerations for semiconductor factories

Min Hsiung Hung, Rui Wen Ho, Fan Tien Cheng

研究成果: Conference contribution

2 引文 斯高帕斯(Scopus)

摘要

In this paper, new-generation software technologies and object-oriented technologies, such as Web Services, XML signature, XML encryption, UML, etc., are used to develop an e-Diagnostics framework for semiconductor factories. The proposed framework can achieve the automaton of diagnostic processes and the integration of diagnostics information under a secure communication infrastructure. Specifically, several measures, such as single sign-on authentication and authorization, confirmation of data accuracy, assurance of information confidentiality, management of system users, and auditing of system operations, are designed to enhance the overall system security. The proposed framework can be applied to construct e-Diagnostics systems for the semiconductor industry.

原文English
主出版物標題2004 Semiconductor Manufacturing Technology Workshop Proceedings, SMTW
頁面37-40
頁數4
出版狀態Published - 2004 12月 1
事件2004 Semiconductor Manufacturing Technology Workshop Proceedings, SMTW - , Taiwan
持續時間: 2004 9月 92004 9月 10

出版系列

名字2004 Semiconductor Manufacturing Technology Workshop Proceedings, SMTW

Other

Other2004 Semiconductor Manufacturing Technology Workshop Proceedings, SMTW
國家/地區Taiwan
期間04-09-0904-09-10

All Science Journal Classification (ASJC) codes

  • 一般工程

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