An efficient diagnosis method to deal with multiple fault-pairs simultaneously using a single circuit model

Cheng Hung Wu, Kuen-Jong Lee, Wei Cheng Lien

研究成果: Conference contribution

10 引文 斯高帕斯(Scopus)

摘要

This paper proposes an efficient diagnosis-aware ATPG method that can quickly identify equivalent-fault pairs and generate diagnosis patterns for nonequivalent-fault pairs, where an (non)equivalent-fault pair contains two stuck-at faults that are (not) equivalent. A novel fault injection method is developed which allows one to embed all fault pairs undistinguished by the conventional test patterns into a circuit model with only one copy of the original circuit. Each pair of faults to be processed is transformed to a stuck-at fault and all fault pairs can be dealt with by invoking an ordinary ATPG tool for stuck-at faults just once. High efficiency of diagnosis pattern generation can be achieved due to 1) the circuit to be processed is read only once, 2) the data structure for ATPG process is constructed only once, 3) multiple fault pairs can be processed at a time, and 4) only one copy of the original circuit is needed. Experimental results show that this is the first reported work that can achieve 100% diagnosis resolutions for all ISCAS'89 and IWLS'05 benchmark circuits using an ordinary ATPG tool. Furthermore, we also find that the total number of patterns required to deal with all fault pairs in our method is smaller than that of the current state-of-the-art work.

原文English
主出版物標題Proceedings - 2014 IEEE 32nd VLSI Test Symposium, VTS 2014
發行者IEEE Computer Society
ISBN(列印)9781479926114
DOIs
出版狀態Published - 2014 一月 1
事件2014 IEEE 32nd VLSI Test Symposium, VTS 2014 - Napa, CA, United States
持續時間: 2014 四月 132014 四月 17

出版系列

名字Proceedings of the IEEE VLSI Test Symposium

Other

Other2014 IEEE 32nd VLSI Test Symposium, VTS 2014
國家United States
城市Napa, CA
期間14-04-1314-04-17

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering

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