An improved two-load method for whole-field complete photoelastic fringe analysis

Terry Yuan-Fang Chen, H. L. Lee, Y. C. Chou

研究成果: Article

4 引文 (Scopus)

摘要

An improved two-load method for whole-field complete determination of photoelastic parameters is presented. The dark-field isoclinic images are used to determine the isoclinic angles. Using two isoclinic maps obtained from two different loads effectively compensates the indeterminable points. The use of dark-field and light-field photoelastic images for normalization extends the two-load method to analyze dark-field photoelastic fringe patterns and avoids model movement. Larger errors on the determined fringe orders are further reduced by a least-squares quadric fitting. The results are compared well to the theoretical ones. Further comparison of the improved two-load method and the two-wavelength method are given.

原文English
頁(從 - 到)199-203
頁數5
期刊Journal of Mechanics
21
發行號3
DOIs
出版狀態Published - 2005 一月 1

指紋

Fringe Analysis
Wavelength
Quadric
diffraction patterns
Normalization
Least Squares
Angle
wavelengths

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Mechanical Engineering
  • Applied Mathematics

引用此文

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An improved two-load method for whole-field complete photoelastic fringe analysis. / Chen, Terry Yuan-Fang; Lee, H. L.; Chou, Y. C.

於: Journal of Mechanics, 卷 21, 編號 3, 01.01.2005, p. 199-203.

研究成果: Article

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AB - An improved two-load method for whole-field complete determination of photoelastic parameters is presented. The dark-field isoclinic images are used to determine the isoclinic angles. Using two isoclinic maps obtained from two different loads effectively compensates the indeterminable points. The use of dark-field and light-field photoelastic images for normalization extends the two-load method to analyze dark-field photoelastic fringe patterns and avoids model movement. Larger errors on the determined fringe orders are further reduced by a least-squares quadric fitting. The results are compared well to the theoretical ones. Further comparison of the improved two-load method and the two-wavelength method are given.

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