摘要
An improved two-load method for whole-field complete determination of photoelastic parameters is presented. The dark-field isoclinic images are used to determine the isoclinic angles. Using two isoclinic maps obtained from two different loads effectively compensates the indeterminable points. The use of dark-field and light-field photoelastic images for normalization extends the two-load method to analyze dark-field photoelastic fringe patterns and avoids model movement. Larger errors on the determined fringe orders are further reduced by a least-squares quadric fitting. The results are compared well to the theoretical ones. Further comparison of the improved two-load method and the two-wavelength method are given.
原文 | English |
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頁(從 - 到) | 199-203 |
頁數 | 5 |
期刊 | Journal of Mechanics |
卷 | 21 |
發行號 | 3 |
DOIs | |
出版狀態 | Published - 2005 9月 |
All Science Journal Classification (ASJC) codes
- 凝聚態物理學
- 機械工業
- 應用數學