TY - GEN
T1 - An instantaneous phase shifting ESPI system for dynamic deformation measurement
AU - Chen, T. Y.
AU - Chen, C. H.
PY - 2011
Y1 - 2011
N2 - In this study, an ESPI measurement system which is capable of grabbing four phase-shifted interferometric images instantaneously (or simultaneously) is developed for out-of-plane dynamic deformation measurement. A new polarization phase-shifting interferometric system is designed. The system constructed allows the four phase-shifted images to be grabbed by four CCD simultaneously. And digital image correlation method was applied to correct the pixel position mismatch among the four images. Thereafter, the phase at each pixel can be calculated for further obtaining the out-of-plane displacement. Test of the system on an edge-clamped circular plate heated from behind is demonstrated. The results reveal that the proposed system is applicable for the dynamic deformation measurement.
AB - In this study, an ESPI measurement system which is capable of grabbing four phase-shifted interferometric images instantaneously (or simultaneously) is developed for out-of-plane dynamic deformation measurement. A new polarization phase-shifting interferometric system is designed. The system constructed allows the four phase-shifted images to be grabbed by four CCD simultaneously. And digital image correlation method was applied to correct the pixel position mismatch among the four images. Thereafter, the phase at each pixel can be calculated for further obtaining the out-of-plane displacement. Test of the system on an edge-clamped circular plate heated from behind is demonstrated. The results reveal that the proposed system is applicable for the dynamic deformation measurement.
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U2 - 10.1007/978-1-4614-0228-2_34
DO - 10.1007/978-1-4614-0228-2_34
M3 - Conference contribution
AN - SCOPUS:84860162015
SN - 9781461402275
T3 - Conference Proceedings of the Society for Experimental Mechanics Series
SP - 279
EP - 283
BT - Optical Measurements, Modeling, and Metrology - Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
PB - Springer New York LLC
T2 - 2011 SEM Annual Conference on Experimental and Applied Mechanics
Y2 - 13 June 2011 through 16 June 2011
ER -