An instantaneous phase shifting ESPI system for dynamic deformation measurement

T. Y. Chen, C. H. Chen

研究成果: Conference contribution

5 引文 斯高帕斯(Scopus)

摘要

In this study, an ESPI measurement system which is capable of grabbing four phase-shifted interferometric images instantaneously (or simultaneously) is developed for out-of-plane dynamic deformation measurement. A new polarization phase-shifting interferometric system is designed. The system constructed allows the four phase-shifted images to be grabbed by four CCD simultaneously. And digital image correlation method was applied to correct the pixel position mismatch among the four images. Thereafter, the phase at each pixel can be calculated for further obtaining the out-of-plane displacement. Test of the system on an edge-clamped circular plate heated from behind is demonstrated. The results reveal that the proposed system is applicable for the dynamic deformation measurement.

原文English
主出版物標題Optical Measurements, Modeling, and Metrology - Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
發行者Springer New York LLC
頁面279-283
頁數5
ISBN(列印)9781461402275
DOIs
出版狀態Published - 2011 一月 1
事件2011 SEM Annual Conference on Experimental and Applied Mechanics - Uncasville, CT, United States
持續時間: 2011 六月 132011 六月 16

出版系列

名字Conference Proceedings of the Society for Experimental Mechanics Series
5
ISSN(列印)2191-5644
ISSN(電子)2191-5652

Other

Other2011 SEM Annual Conference on Experimental and Applied Mechanics
國家United States
城市Uncasville, CT
期間11-06-1311-06-16

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Computational Mechanics
  • Mechanical Engineering

指紋 深入研究「An instantaneous phase shifting ESPI system for dynamic deformation measurement」主題。共同形成了獨特的指紋。

引用此