Analysis of Back-Contact Interface Recombination in Thin-Film Solar Cells

Sanjoy Paul, Sachit Grover, Ingrid L. Repins, Brian M. Keyes, Miguel A. Contreras, Kannan Ramanathan, Rommel Noufi, Zhibo Zhao, Feng Liao, Jian V. Li

研究成果: Article

6 引文 斯高帕斯(Scopus)

摘要

The open-circuit voltage (VOC) in a generic TCO/buffer/absorber/back-contact thin-film solar cell device is a key parameter in the recombination analysis. In particular, VOC is sensitively influenced by the interface recombination at the buffer/absorber front interface and at the absorber/back-contact interface. This paper reports the temperature, excitation light intensity, and wavelength-dependent open-circuit voltage analysis to separate and quantify recombination rates in solar cells at the front and back interfaces, in the depletion regions, and in the quasi-neutral region. The wavelength-dependent VOC analysis is exploited to extract the absorber/back-contact recombination coefficient. The experimentally observed results are verified using SCAPS-1D (one dimensional - a solar cell capacitance simulator) simulation.

原文English
頁(從 - 到)871-878
頁數8
期刊IEEE Journal of Photovoltaics
8
發行號3
DOIs
出版狀態Published - 2018 五月

    指紋

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

引用此

Paul, S., Grover, S., Repins, I. L., Keyes, B. M., Contreras, M. A., Ramanathan, K., Noufi, R., Zhao, Z., Liao, F., & Li, J. V. (2018). Analysis of Back-Contact Interface Recombination in Thin-Film Solar Cells. IEEE Journal of Photovoltaics, 8(3), 871-878. https://doi.org/10.1109/JPHOTOV.2018.2819664