Analysis of Back-Contact Interface Recombination in Thin-Film Solar Cells

Sanjoy Paul, Sachit Grover, Ingrid L. Repins, Brian M. Keyes, Miguel A. Contreras, Kannan Ramanathan, Rommel Noufi, Zhibo Zhao, Feng Liao, Jian V. Li

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10 引文 斯高帕斯(Scopus)


The open-circuit voltage (VOC) in a generic TCO/buffer/absorber/back-contact thin-film solar cell device is a key parameter in the recombination analysis. In particular, VOC is sensitively influenced by the interface recombination at the buffer/absorber front interface and at the absorber/back-contact interface. This paper reports the temperature, excitation light intensity, and wavelength-dependent open-circuit voltage analysis to separate and quantify recombination rates in solar cells at the front and back interfaces, in the depletion regions, and in the quasi-neutral region. The wavelength-dependent VOC analysis is exploited to extract the absorber/back-contact recombination coefficient. The experimentally observed results are verified using SCAPS-1D (one dimensional - a solar cell capacitance simulator) simulation.

頁(從 - 到)871-878
期刊IEEE Journal of Photovoltaics
出版狀態Published - 2018 五月

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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