This paper presents a comprehensive investigation of several important error sources for the successive-approximation register (SAR) analog-to-digital converters (ADCs). The error sources that we discuss in this paper include the dynamic comparator offset, the dynamic gain error of digital-to-analog converter (DAC), the capacitor mismatch of capacitive DAC, the incomplete settling of DAC, the undershoot of reference voltage, and the input signal coupling. The integral/differential nonlinearities (INL/DNL) of SAR ADCs that are resulted from these error sources are analyzed and addressed. A diagnostic procedure is presented to identify the possible error sources based on the INL/DNL plots. In addition, design suggestions for overcoming these problems are also offered and recommended in this paper.
|頁（從 - 到）||1804-1817|
|期刊||IEEE Transactions on Instrumentation and Measurement|
|出版狀態||Published - 2016 8月|
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