TY - JOUR
T1 - Analysis of variance on thickness and electrical conductivity measurements of carbon nanotube thin films
AU - Li, Min Yang
AU - Yang, Mingchia
AU - Vargas, Emily
AU - Neff, Kyle
AU - Vanli, Arda
AU - Liang, Richard
N1 - Publisher Copyright:
© 2016 IOP Publishing Ltd.
PY - 2016/7/19
Y1 - 2016/7/19
N2 - One of the major challenges towards controlling the transfer of electrical and mechanical properties of nanotubes into nanocomposites is the lack of adequate measurement systems to quantify the variations in bulk properties while the nanotubes were used as the reinforcement material. In this study, we conducted one-way analysis of variance (ANOVA) on thickness and conductivity measurements. By analyzing the data collected from both experienced and inexperienced operators, we found some operation details users might overlook that resulted in variations, since conductivity measurements of CNT thin films are very sensitive to thickness measurements. In addition, we demonstrated how issues in measurements damaged samples and limited the number of replications resulting in large variations in the electrical conductivity measurement results. Based on this study, we proposed a faster, more reliable approach to measure the thickness of CNT thin films that operators can follow to make these measurement processes less dependent on operator skills.
AB - One of the major challenges towards controlling the transfer of electrical and mechanical properties of nanotubes into nanocomposites is the lack of adequate measurement systems to quantify the variations in bulk properties while the nanotubes were used as the reinforcement material. In this study, we conducted one-way analysis of variance (ANOVA) on thickness and conductivity measurements. By analyzing the data collected from both experienced and inexperienced operators, we found some operation details users might overlook that resulted in variations, since conductivity measurements of CNT thin films are very sensitive to thickness measurements. In addition, we demonstrated how issues in measurements damaged samples and limited the number of replications resulting in large variations in the electrical conductivity measurement results. Based on this study, we proposed a faster, more reliable approach to measure the thickness of CNT thin films that operators can follow to make these measurement processes less dependent on operator skills.
UR - http://www.scopus.com/inward/record.url?scp=84985942482&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84985942482&partnerID=8YFLogxK
U2 - 10.1088/0957-0233/27/9/095004
DO - 10.1088/0957-0233/27/9/095004
M3 - Article
AN - SCOPUS:84985942482
SN - 0957-0233
VL - 27
JO - Measurement Science and Technology
JF - Measurement Science and Technology
IS - 9
M1 - 095004
ER -