Analyzing throughput of power and thermal-constraint multicore processor under NBTI effect

Shi Qun Zheng; Ing-Chao Lin; Yen Han Lee

doi:10.1145/1973009.1973097

Analyzing throughput of power and thermal-constraint multicore processor under NBTI effect

Shi Qun Zheng, Ing-Chao Lin, Yen Han Lee

資訊工程學系

研究成果: Conference contribution

摘要

NBTI (Negative Bias Temperature Instability) which can degrade the switching speed of PMOS transistors has become a major reliability challenge. In this paper, we investigate the throughput impact of NBTI on power and thermal-constraint multicore processors and show up to 30% degradation when both process variation and NBIT are considered. Then we evaluate the effectiveness of core rotation, adaptive voltage scaling and adaptive body biasing to improve the throughput of power and thermal constrained multicore processors. Our experimental results demonstrate 11.1% improvement in VDD is sufficient to guarantee throughput after 10-yr NBTI influence when processor variation is not considered. In contract, ABB technique is not able to recover throughput loss caused by NBTI.

原文	English
主出版物標題	GLSVLSI'11 - Proceedings of the 2011 Great Lakes Symposium on VLSI
頁面	415-418
頁數	4
DOIs	https://doi.org/10.1145/1973009.1973097
出版狀態	Published - 2011 六月 3
事件	21st Great Lakes Symposium on VLSI, GLSVLSI 2011 - Lausanne, Switzerland 持續時間: 2011 五月 2 → 2011 五月 4

出版系列

名字	Proceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI

Other

Other	21st Great Lakes Symposium on VLSI, GLSVLSI 2011
國家	Switzerland
城市	Lausanne
期間	11-05-02 → 11-05-04

All Science Journal Classification (ASJC) codes

Engineering(all)

存取文件

10.1145/1973009.1973097

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引用此

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title = "Analyzing throughput of power and thermal-constraint multicore processor under NBTI effect",

abstract = "NBTI (Negative Bias Temperature Instability) which can degrade the switching speed of PMOS transistors has become a major reliability challenge. In this paper, we investigate the throughput impact of NBTI on power and thermal-constraint multicore processors and show up to 30% degradation when both process variation and NBIT are considered. Then we evaluate the effectiveness of core rotation, adaptive voltage scaling and adaptive body biasing to improve the throughput of power and thermal constrained multicore processors. Our experimental results demonstrate 11.1% improvement in VDD is sufficient to guarantee throughput after 10-yr NBTI influence when processor variation is not considered. In contract, ABB technique is not able to recover throughput loss caused by NBTI.",

author = "Zheng, {Shi Qun} and Ing-Chao Lin and Lee, {Yen Han}",

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note = "21st Great Lakes Symposium on VLSI, GLSVLSI 2011 ; Conference date: 02-05-2011 Through 04-05-2011",

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Zheng, SQ, Lin, I-C & Lee, YH 2011, Analyzing throughput of power and thermal-constraint multicore processor under NBTI effect. 於 GLSVLSI'11 - Proceedings of the 2011 Great Lakes Symposium on VLSI. Proceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI, 頁 415-418, 21st Great Lakes Symposium on VLSI, GLSVLSI 2011, Lausanne, Switzerland, 11-05-02. https://doi.org/10.1145/1973009.1973097

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