Analyzing throughput of power and thermal-constraint multicore processor under NBTI effect

Shi Qun Zheng, Ing-Chao Lin, Yen Han Lee

研究成果: Conference contribution

摘要

NBTI (Negative Bias Temperature Instability) which can degrade the switching speed of PMOS transistors has become a major reliability challenge. In this paper, we investigate the throughput impact of NBTI on power and thermal-constraint multicore processors and show up to 30% degradation when both process variation and NBIT are considered. Then we evaluate the effectiveness of core rotation, adaptive voltage scaling and adaptive body biasing to improve the throughput of power and thermal constrained multicore processors. Our experimental results demonstrate 11.1% improvement in VDD is sufficient to guarantee throughput after 10-yr NBTI influence when processor variation is not considered. In contract, ABB technique is not able to recover throughput loss caused by NBTI.

原文English
主出版物標題GLSVLSI'11 - Proceedings of the 2011 Great Lakes Symposium on VLSI
頁面415-418
頁數4
DOIs
出版狀態Published - 2011 六月 3
事件21st Great Lakes Symposium on VLSI, GLSVLSI 2011 - Lausanne, Switzerland
持續時間: 2011 五月 22011 五月 4

出版系列

名字Proceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI

Other

Other21st Great Lakes Symposium on VLSI, GLSVLSI 2011
國家Switzerland
城市Lausanne
期間11-05-0211-05-04

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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