APPARATUS AND METHOD FOR MEASURING ELECTRICAL PARAMETERS OF CIRCUIT

貢獻的翻譯標題: 用以量測一電路之複數電性參數的量測裝置及其量測方法

Chu-Sing Yang (Inventor)

研究成果: Patent

摘要

An apparatus for measuring an electrical parameter of a circuit includes a measuring unit, a plurality of connection terminals and a selection switch. The measuring unit measures the electrical parameter. The selection switch selectively causes a conduction between the selection switch and at least one of the plurality of connection terminals
貢獻的翻譯標題用以量測一電路之複數電性參數的量測裝置及其量測方法
原文English
專利號9063169
出版狀態Published - 1800

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