Application of a New Inversion Algorithm Based on Multi-Layer Model Hypothesis for Testing Stress-Depth Profiles by Multi-Frequency EC Method

Jingyu DI, Cunfu He, Yung Chun Lee, Xiucheng Liu, Wanli Shang

研究成果: Article同行評審

指紋

深入研究「Application of a New Inversion Algorithm Based on Multi-Layer Model Hypothesis for Testing Stress-Depth Profiles by Multi-Frequency EC Method」主題。共同形成了獨特的指紋。

Chemical Compounds

Engineering & Materials Science