Artifacts in near-field scanning optical microscope spectroscopy and imaging of nanoparticles

Shih-hui Chang, Yun Chorng Chang

研究成果: Conference contribution

摘要

NSOM spectroscopy and imaging of nanoparticles in both illumination and collection mode were studied. The artifacts of red-shifting in NSOM spectra and polarization dependant dark fringe patterns associated with each scattering resonant peak were explained.

原文English
主出版物標題Quantum Electronics and Laser Science Conference, QELS 2008
發行者Optical Society of America
ISBN(列印)9781557528599
出版狀態Published - 2008 一月 1
事件Quantum Electronics and Laser Science Conference, QELS 2008 - San Jose, CA, United States
持續時間: 2008 五月 42008 五月 9

出版系列

名字Optics InfoBase Conference Papers
ISSN(電子)2162-2701

Other

OtherQuantum Electronics and Laser Science Conference, QELS 2008
國家/地區United States
城市San Jose, CA
期間08-05-0408-05-09

All Science Journal Classification (ASJC) codes

  • 儀器
  • 原子與分子物理與光學

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