Artifacts in near-field scanning optical microscope spectroscopy and imaging of nanoparticles

Shih-hui Chang, Yun Chorng Chang

研究成果: Conference contribution

摘要

NSOM spectroscopy and imaging of nanoparticles in both illumination and collection mode were studied. The artifacts of red-shifting in NSOM spectra and polarization dependant dark fringe patterns associated with each scattering resonant peak were explained.

原文English
主出版物標題2008 Conference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics, CLEO/QELS
DOIs
出版狀態Published - 2008 九月 15
事件Conference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics, CLEO/QELS 2008 - San Jose, CA, United States
持續時間: 2008 五月 42008 五月 9

出版系列

名字2008 Conference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics, CLEO/QELS

Other

OtherConference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics, CLEO/QELS 2008
國家/地區United States
城市San Jose, CA
期間08-05-0408-05-09

All Science Journal Classification (ASJC) codes

  • 電氣與電子工程
  • 電子、光磁材料

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