Artifacts in near-field scanning optical microscope spectroscopy and imaging of nanoparticles

Shih-hui Chang, Yun Chorng Chang

研究成果: Conference contribution

摘要

NSOM spectroscopy and imaging of nanoparticles in both illumination and collection mode were studied. The artifacts of red-shifting in NSOM spectra and polarization dependant dark fringe patterns associated with each scattering resonant peak were explained.

原文English
主出版物標題Conference on Lasers and Electro-Optics, CLEO 2008
發行者Optical Society of America
ISBN(列印)9781557528599
出版狀態Published - 2008
事件Conference on Lasers and Electro-Optics, CLEO 2008 - San Jose, CA, United States
持續時間: 2008 五月 42008 五月 9

Other

OtherConference on Lasers and Electro-Optics, CLEO 2008
國家/地區United States
城市San Jose, CA
期間08-05-0408-05-09

All Science Journal Classification (ASJC) codes

  • 儀器
  • 原子與分子物理與光學

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