Asian test symposium - Past, present and future - Past, p

Michiko Inoue, Xiaowei Li, Cheng Wen Wu

研究成果: Conference contribution

摘要

The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind. ATS has been annually held for 27 years at 23 cities (four cities, Beijing, Shanghai, Hiroshima, and Taipei hosted ATS twice). Fig. 1 shows the venues of ATS including three coming ATS. During these years, ATS has been provided the opportunity to deeply discuss test technology and enhance networking in the research and geographical regions. ATS will continuously play this role in the future.

原文English
主出版物標題2019 IEEE International Test Conference, ITC 2019
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781728148236
DOIs
出版狀態Published - 2019 十一月
事件2019 IEEE International Test Conference, ITC 2019 - Washington, United States
持續時間: 2019 十一月 92019 十一月 15

出版系列

名字Proceedings - International Test Conference
2019-November
ISSN(列印)1089-3539

Conference

Conference2019 IEEE International Test Conference, ITC 2019
國家United States
城市Washington
期間19-11-0919-11-15

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Applied Mathematics

指紋 深入研究「Asian test symposium - Past, present and future - Past, p」主題。共同形成了獨特的指紋。

引用此