The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind. ATS has been annually held for 27 years at 23 cities (four cities, Beijing, Shanghai, Hiroshima, and Taipei hosted ATS twice). Fig. 1 shows the venues of ATS including three coming ATS. During these years, ATS has been provided the opportunity to deeply discuss test technology and enhance networking in the research and geographical regions. ATS will continuously play this role in the future.