Atomristors: Memory Effect in Atomically-thin Sheets and Record RF Switches

Ruijing Ge, Xiaohan Wu, Myungsoo Kim, Po An Chen, Jianping Shi, Junho Choi, Xiaoqin Li, Yanfeng Zhang, Meng Hsueh Chiang, Jack C. Lee, Deji Akinwande

研究成果: Conference contribution

摘要

Non-volatile resistive switching (NVRS) has been recently observed with synthesized monolayer molybdenum disulfide (MoS 2 ) as the active layer and termed atomristors [1]. In this paper, we demonstrate the fastest switching speed (<15 ns) among all crystalline two-dimensional (2D) related NVRS devices to the best of our knowledge. For the first time, ab-initio simulation results of atomristors elucidate the mechanism revealing favorable substitution of specific metal ions into sulfur vacancies during switching. This insight combined with area-scaling experimental studies indicate a local conductive-bridge-like nature. The proposed mechanism is further supported by sulfur annealing recovery phenomenon. Moreover, exfoliated MoS 2 monolayer is demonstrated to have memory effect for the first time, expanding the materials beyond synthesized films. State-of-the-art non-volatile RF switches based on MoS 2 atomristors were prepared, featuring 0.25 dB insertion loss, 29 dB isolation (both at 67 GHz), and 70 THz cutoff frequency, a record performance compared to emerging RF switches. Our pioneering work suggests that memory effect maybe present in dozens or 100s of 2D monolayers similar to MoS 2 paving the path for new scientific studies for understanding the rich physics, and engineering research towards diverse device applications.

原文English
主出版物標題2018 IEEE International Electron Devices Meeting, IEDM 2018
發行者Institute of Electrical and Electronics Engineers Inc.
頁面22.6.1-22.6.4
ISBN(電子)9781728119878
DOIs
出版狀態Published - 2019 一月 16
事件64th Annual IEEE International Electron Devices Meeting, IEDM 2018 - San Francisco, United States
持續時間: 2018 十二月 12018 十二月 5

出版系列

名字Technical Digest - International Electron Devices Meeting, IEDM
2018-December
ISSN(列印)0163-1918

Conference

Conference64th Annual IEEE International Electron Devices Meeting, IEDM 2018
國家United States
城市San Francisco
期間18-12-0118-12-05

    指紋

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

引用此

Ge, R., Wu, X., Kim, M., Chen, P. A., Shi, J., Choi, J., Li, X., Zhang, Y., Chiang, M. H., Lee, J. C., & Akinwande, D. (2019). Atomristors: Memory Effect in Atomically-thin Sheets and Record RF Switches. 於 2018 IEEE International Electron Devices Meeting, IEDM 2018 (頁 22.6.1-22.6.4). [8614602] (Technical Digest - International Electron Devices Meeting, IEDM; 卷 2018-December). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IEDM.2018.8614602