Automata Based Test Plans for Fault Diagnosis in Batch Processes

Chuei Tin Chang, Wei Chung Hsieh

研究成果: Chapter

摘要

Hardware failures are inevitable but random events in the useful life of any batch chemical plant. If such incidents are not efficiently diagnosed, the consequences may be very serious and sometimes even catastrophic. The present study aims to develop a systematic procedure-synthesis strategy for generating the test plans that minimize the chance of misjudgements. By modelling the components in the given system with timed automata, all possible fault propagation scenarios and their observable event traces (OETs) can be enumerated. The test procedure for every OET can then be conjectured by designing a supervisory controller to achieve the highest level of diagnostic resolution. One example is provided to show the feasibility of the proposed approach.

原文English
主出版物標題Computer Aided Chemical Engineering
發行者Elsevier B.V.
頁面1781-1786
頁數6
DOIs
出版狀態Published - 2015 一月 1

出版系列

名字Computer Aided Chemical Engineering
37
ISSN(列印)1570-7946

All Science Journal Classification (ASJC) codes

  • 化學工程 (全部)
  • 電腦科學應用

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