摘要
Reducing the sampling rate to as low as possible is a high priority for many factories to reduce production cost. Automatic virtual metrology based intelligent sampling decision (ISD) scheme had been previously developed for reducing the sampling rate and sustaining the virtual metrology (VM) accuracy. However, the desired sampling rate of the ISD scheme is fixed and set manually. Hence, whenever the VM accuracy gets worse, it cannot adaptively increase the default sampling rate in the ISD scheme. As a consequence, it would take more time to collect enough samples for improving the VM accuracy. Moreover, when the VM accuracy performs well all the time, it cannot automatically decrease the default sampling rate in ISD, which may result in unnecessary waste. Accordingly, this paper proposes an automated sampling decision (ASD) scheme to adaptively and automatically modify the sampling rate online and in real time for continuous improvement. The ASD scheme can monitor the VM accuracy online as well as update the VM models in real time for maintaining the VM accuracy when the VM accuracy becomes poor. Also, the ASD scheme can automatically reduce the sampling rate while the VM accuracy performs well.
| 原文 | English |
|---|---|
| 頁（從 - 到） | 6351-6366 |
| 頁數 | 16 |
| 期刊 | International Journal of Production Research |
| 卷 | 54 |
| 發行號 | 21 |
| DOIs | |
| 出版狀態 | Published - 2016 十一月 1 |
指紋
All Science Journal Classification (ASJC) codes
- Strategy and Management
- Management Science and Operations Research
- Industrial and Manufacturing Engineering
引用此文
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Automated sampling decision scheme for the AVM system. / Cheng, Fan Tien; Hsieh, Yao Sheng; Chen, Chun Fang; Lyu, Jhao Rong.
於: International Journal of Production Research, 卷 54, 編號 21, 01.11.2016, p. 6351-6366.研究成果: Article
TY - JOUR
T1 - Automated sampling decision scheme for the AVM system
AU - Cheng, Fan Tien
AU - Hsieh, Yao Sheng
AU - Chen, Chun Fang
AU - Lyu, Jhao Rong
PY - 2016/11/1
Y1 - 2016/11/1
N2 - Reducing the sampling rate to as low as possible is a high priority for many factories to reduce production cost. Automatic virtual metrology based intelligent sampling decision (ISD) scheme had been previously developed for reducing the sampling rate and sustaining the virtual metrology (VM) accuracy. However, the desired sampling rate of the ISD scheme is fixed and set manually. Hence, whenever the VM accuracy gets worse, it cannot adaptively increase the default sampling rate in the ISD scheme. As a consequence, it would take more time to collect enough samples for improving the VM accuracy. Moreover, when the VM accuracy performs well all the time, it cannot automatically decrease the default sampling rate in ISD, which may result in unnecessary waste. Accordingly, this paper proposes an automated sampling decision (ASD) scheme to adaptively and automatically modify the sampling rate online and in real time for continuous improvement. The ASD scheme can monitor the VM accuracy online as well as update the VM models in real time for maintaining the VM accuracy when the VM accuracy becomes poor. Also, the ASD scheme can automatically reduce the sampling rate while the VM accuracy performs well.
AB - Reducing the sampling rate to as low as possible is a high priority for many factories to reduce production cost. Automatic virtual metrology based intelligent sampling decision (ISD) scheme had been previously developed for reducing the sampling rate and sustaining the virtual metrology (VM) accuracy. However, the desired sampling rate of the ISD scheme is fixed and set manually. Hence, whenever the VM accuracy gets worse, it cannot adaptively increase the default sampling rate in the ISD scheme. As a consequence, it would take more time to collect enough samples for improving the VM accuracy. Moreover, when the VM accuracy performs well all the time, it cannot automatically decrease the default sampling rate in ISD, which may result in unnecessary waste. Accordingly, this paper proposes an automated sampling decision (ASD) scheme to adaptively and automatically modify the sampling rate online and in real time for continuous improvement. The ASD scheme can monitor the VM accuracy online as well as update the VM models in real time for maintaining the VM accuracy when the VM accuracy becomes poor. Also, the ASD scheme can automatically reduce the sampling rate while the VM accuracy performs well.
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UR - http://www.scopus.com/inward/citedby.url?scp=84938821079&partnerID=8YFLogxK
U2 - 10.1080/00207543.2015.1072649
DO - 10.1080/00207543.2015.1072649
M3 - Article
AN - SCOPUS:84938821079
VL - 54
SP - 6351
EP - 6366
JO - International Journal of Production Research
JF - International Journal of Production Research
SN - 0020-7543
IS - 21
ER -