Automated sampling decision scheme for the AVM system

Fan Tien Cheng, Yao Sheng Hsieh, Chun Fang Chen, Jhao Rong Lyu

研究成果: Article

1 引文 (Scopus)

摘要

Reducing the sampling rate to as low as possible is a high priority for many factories to reduce production cost. Automatic virtual metrology based intelligent sampling decision (ISD) scheme had been previously developed for reducing the sampling rate and sustaining the virtual metrology (VM) accuracy. However, the desired sampling rate of the ISD scheme is fixed and set manually. Hence, whenever the VM accuracy gets worse, it cannot adaptively increase the default sampling rate in the ISD scheme. As a consequence, it would take more time to collect enough samples for improving the VM accuracy. Moreover, when the VM accuracy performs well all the time, it cannot automatically decrease the default sampling rate in ISD, which may result in unnecessary waste. Accordingly, this paper proposes an automated sampling decision (ASD) scheme to adaptively and automatically modify the sampling rate online and in real time for continuous improvement. The ASD scheme can monitor the VM accuracy online as well as update the VM models in real time for maintaining the VM accuracy when the VM accuracy becomes poor. Also, the ASD scheme can automatically reduce the sampling rate while the VM accuracy performs well.

原文English
頁(從 - 到)6351-6366
頁數16
期刊International Journal of Production Research
54
發行號21
DOIs
出版狀態Published - 2016 十一月 1

指紋

Sampling
Industrial plants

All Science Journal Classification (ASJC) codes

  • Strategy and Management
  • Management Science and Operations Research
  • Industrial and Manufacturing Engineering

引用此文

Cheng, Fan Tien ; Hsieh, Yao Sheng ; Chen, Chun Fang ; Lyu, Jhao Rong. / Automated sampling decision scheme for the AVM system. 於: International Journal of Production Research. 2016 ; 卷 54, 編號 21. 頁 6351-6366.
@article{83c24861ac9a4326affc43fe5910e4ca,
title = "Automated sampling decision scheme for the AVM system",
abstract = "Reducing the sampling rate to as low as possible is a high priority for many factories to reduce production cost. Automatic virtual metrology based intelligent sampling decision (ISD) scheme had been previously developed for reducing the sampling rate and sustaining the virtual metrology (VM) accuracy. However, the desired sampling rate of the ISD scheme is fixed and set manually. Hence, whenever the VM accuracy gets worse, it cannot adaptively increase the default sampling rate in the ISD scheme. As a consequence, it would take more time to collect enough samples for improving the VM accuracy. Moreover, when the VM accuracy performs well all the time, it cannot automatically decrease the default sampling rate in ISD, which may result in unnecessary waste. Accordingly, this paper proposes an automated sampling decision (ASD) scheme to adaptively and automatically modify the sampling rate online and in real time for continuous improvement. The ASD scheme can monitor the VM accuracy online as well as update the VM models in real time for maintaining the VM accuracy when the VM accuracy becomes poor. Also, the ASD scheme can automatically reduce the sampling rate while the VM accuracy performs well.",
author = "Cheng, {Fan Tien} and Hsieh, {Yao Sheng} and Chen, {Chun Fang} and Lyu, {Jhao Rong}",
year = "2016",
month = "11",
day = "1",
doi = "10.1080/00207543.2015.1072649",
language = "English",
volume = "54",
pages = "6351--6366",
journal = "International Journal of Production Research",
issn = "0020-7543",
publisher = "Taylor and Francis Ltd.",
number = "21",

}

Automated sampling decision scheme for the AVM system. / Cheng, Fan Tien; Hsieh, Yao Sheng; Chen, Chun Fang; Lyu, Jhao Rong.

於: International Journal of Production Research, 卷 54, 編號 21, 01.11.2016, p. 6351-6366.

研究成果: Article

TY - JOUR

T1 - Automated sampling decision scheme for the AVM system

AU - Cheng, Fan Tien

AU - Hsieh, Yao Sheng

AU - Chen, Chun Fang

AU - Lyu, Jhao Rong

PY - 2016/11/1

Y1 - 2016/11/1

N2 - Reducing the sampling rate to as low as possible is a high priority for many factories to reduce production cost. Automatic virtual metrology based intelligent sampling decision (ISD) scheme had been previously developed for reducing the sampling rate and sustaining the virtual metrology (VM) accuracy. However, the desired sampling rate of the ISD scheme is fixed and set manually. Hence, whenever the VM accuracy gets worse, it cannot adaptively increase the default sampling rate in the ISD scheme. As a consequence, it would take more time to collect enough samples for improving the VM accuracy. Moreover, when the VM accuracy performs well all the time, it cannot automatically decrease the default sampling rate in ISD, which may result in unnecessary waste. Accordingly, this paper proposes an automated sampling decision (ASD) scheme to adaptively and automatically modify the sampling rate online and in real time for continuous improvement. The ASD scheme can monitor the VM accuracy online as well as update the VM models in real time for maintaining the VM accuracy when the VM accuracy becomes poor. Also, the ASD scheme can automatically reduce the sampling rate while the VM accuracy performs well.

AB - Reducing the sampling rate to as low as possible is a high priority for many factories to reduce production cost. Automatic virtual metrology based intelligent sampling decision (ISD) scheme had been previously developed for reducing the sampling rate and sustaining the virtual metrology (VM) accuracy. However, the desired sampling rate of the ISD scheme is fixed and set manually. Hence, whenever the VM accuracy gets worse, it cannot adaptively increase the default sampling rate in the ISD scheme. As a consequence, it would take more time to collect enough samples for improving the VM accuracy. Moreover, when the VM accuracy performs well all the time, it cannot automatically decrease the default sampling rate in ISD, which may result in unnecessary waste. Accordingly, this paper proposes an automated sampling decision (ASD) scheme to adaptively and automatically modify the sampling rate online and in real time for continuous improvement. The ASD scheme can monitor the VM accuracy online as well as update the VM models in real time for maintaining the VM accuracy when the VM accuracy becomes poor. Also, the ASD scheme can automatically reduce the sampling rate while the VM accuracy performs well.

UR - http://www.scopus.com/inward/record.url?scp=84938821079&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84938821079&partnerID=8YFLogxK

U2 - 10.1080/00207543.2015.1072649

DO - 10.1080/00207543.2015.1072649

M3 - Article

AN - SCOPUS:84938821079

VL - 54

SP - 6351

EP - 6366

JO - International Journal of Production Research

JF - International Journal of Production Research

SN - 0020-7543

IS - 21

ER -