Automatic facial skin defect detection system

Chuan Yu Chang, Shang Cheng Li, Pau-Choo Chung, Jui Yi Kuo, Yung Chin Tu

研究成果: Conference contribution

14 引文 斯高帕斯(Scopus)

摘要

Skin analysis is one of the most important procedures before medical cosmetology. Most conventional skin analysis systems are semi-automatic. They often require human intervention. In this study, an automatic facial skin defect detection approach is proposed. The system first detects human face in the facial image. Based on the detected face, facial features are extracted to locate regions of interest. Then, a pattern recognition approach is applied to detect facial skin defects, such as spots and wrinkles, in the regions of interest. For a specific kind of defect, a classifier is designed to provide higher performance for recognition. Using few features extracted from the region of interest, the proposed approach can successfully detect the skin defects. Experimental results demonstrate effectiveness of the proposed approach.

原文English
主出版物標題Proceedings - 2010 International Conference on Broadband, Wireless Computing Communication and Applications, BWCCA 2010
頁面527-532
頁數6
DOIs
出版狀態Published - 2010 十二月 1
事件5th International Conference on Broadband Wireless Computing, Communication and Applications, BWCCA 2010 - Fukuoka, Japan
持續時間: 2010 十一月 42010 十一月 6

出版系列

名字Proceedings - 2010 International Conference on Broadband, Wireless Computing Communication and Applications, BWCCA 2010

Other

Other5th International Conference on Broadband Wireless Computing, Communication and Applications, BWCCA 2010
國家/地區Japan
城市Fukuoka
期間10-11-0410-11-06

All Science Journal Classification (ASJC) codes

  • 電腦網路與通信
  • 電腦科學應用

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