Skin analysis is one of the most important procedures before medical cosmetology. Most conventional skin analysis systems are semi-automatic. They often require human intervention. In this study, an automatic facial skin defect detection approach is proposed. The system first detects human face in the facial image. Based on the detected face, facial features are extracted to locate regions of interest. Then, a pattern recognition approach is applied to detect facial skin defects, such as spots and wrinkles, in the regions of interest. For a specific kind of defect, a classifier is designed to provide higher performance for recognition. Using few features extracted from the region of interest, the proposed approach can successfully detect the skin defects. Experimental results demonstrate effectiveness of the proposed approach.