Automatic Virtual Metrology and Target Value Adjustment for Mass Customization

Hao Tieng, Chun Fang Chen, Fan Tien Cheng, Haw Ching Yang

研究成果: Article

4 引文 (Scopus)

摘要

One of the core values of Industry 4.0 targets to integrate people's demand into manufacturing for enhanced products, systems, and services for a wider variety of increasingly personalized customization of products. Thus, Industry 4.0 advances the traditional manufacturing techniques from mass production toward mass customization (MC). Take wheel machining automation (WMA) as an example. To meet MC expectations, manufacturers should offer customized wheels at a large scale with low cost, short lead-time, and high quality. Thus, WMA cells with MC capability are requested to be designed to have a high degree of quick responsiveness to accurately react on machining-condition changes for manufacturing different wheel types. To meet the requirements of MC production, this work proposes to apply the automatic virtual metrology (AVM) system together with the so-called target-value-adjustment (TVA) scheme. The AVM system was developed by the authors to convert sampling inspections with metrology delay into real-time and on-line total inspection, while the TVA scheme is designed to enhance AVM's adaptive customization capability for automatically and rapidly accomplishing the goals of MC production. To demonstrate the versatility of the AVM-plus-TVA approach, the other example in semiconductor etching process is also illustrated.

原文English
文章編號7801027
頁(從 - 到)546-553
頁數8
期刊IEEE Robotics and Automation Letters
2
發行號2
DOIs
出版狀態Published - 2017 四月 1

指紋

Mass Customization
Metrology
Wheels
Adjustment
Wheel
Machining
Target
Manufacturing
Customization
Automation
Inspection
Industry
Product Systems
Etching
Lead
Convert
Semiconductor materials
Sampling
Semiconductors
Integrate

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Human-Computer Interaction
  • Biomedical Engineering
  • Mechanical Engineering
  • Control and Optimization
  • Artificial Intelligence
  • Computer Science Applications
  • Computer Vision and Pattern Recognition

引用此文

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Automatic Virtual Metrology and Target Value Adjustment for Mass Customization. / Tieng, Hao; Chen, Chun Fang; Cheng, Fan Tien; Yang, Haw Ching.

於: IEEE Robotics and Automation Letters, 卷 2, 編號 2, 7801027, 01.04.2017, p. 546-553.

研究成果: Article

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