Automatic virtual metrology for wheel machining automation

Haw Ching Yang, Hao Tieng, Fan Tien Cheng

研究成果: Article

4 引文 (Scopus)

摘要

Total inspection after wheel machining becomes essential for safety consideration and continuous improvement. However, conducting wheel-by-wheel actual metrology is very expensive and time-consuming. A novel idea is to use virtual metrology (VM) that predicts wheel quality based on process data collected from machine tool with a slight supplement of actual metrology data. The technology of automatic virtual metrology (AVM) has been proposed by the authors and successfully deployed in hi-tech industries, such as semiconductor, display and solar cell. The purpose of this study was to propose an approach to apply the AVM system factory-wide to wheel machining automation (WMA) for achieving total inspection of all the precision items of WMA under mass production environment.

原文English
頁(從 - 到)6367-6377
頁數11
期刊International Journal of Production Research
54
發行號21
DOIs
出版狀態Published - 2016 十一月 1

指紋

Wheels
Machining
Automation
Inspection
Machine tools
Industrial plants
Solar cells
Display devices
Semiconductor materials
Industry
Factory
Safety
Semiconductors
Machine tool
Mass production
Continuous improvement

All Science Journal Classification (ASJC) codes

  • Strategy and Management
  • Management Science and Operations Research
  • Industrial and Manufacturing Engineering

引用此文

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Automatic virtual metrology for wheel machining automation. / Yang, Haw Ching; Tieng, Hao; Cheng, Fan Tien.

於: International Journal of Production Research, 卷 54, 編號 21, 01.11.2016, p. 6367-6377.

研究成果: Article

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