Automatic virtual metrology for wheel machining automation

Haw Ching Yang, Hao Tieng, Fan Tien Cheng

研究成果: Article同行評審

13 引文 斯高帕斯(Scopus)

摘要

Total inspection after wheel machining becomes essential for safety consideration and continuous improvement. However, conducting wheel-by-wheel actual metrology is very expensive and time-consuming. A novel idea is to use virtual metrology (VM) that predicts wheel quality based on process data collected from machine tool with a slight supplement of actual metrology data. The technology of automatic virtual metrology (AVM) has been proposed by the authors and successfully deployed in hi-tech industries, such as semiconductor, display and solar cell. The purpose of this study was to propose an approach to apply the AVM system factory-wide to wheel machining automation (WMA) for achieving total inspection of all the precision items of WMA under mass production environment.

原文English
頁(從 - 到)6367-6377
頁數11
期刊International Journal of Production Research
54
發行號21
DOIs
出版狀態Published - 2016 11月 1

All Science Journal Classification (ASJC) codes

  • 策略與管理
  • 管理科學與經營研究
  • 工業與製造工程

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