Autonomous Testing for 3D-ICs with IEEE Std. 1687

Jin Cun Ye, Michael A. Kochte, Kuen Jong Lee, Hans Joachim Wunderlich

研究成果: Conference contribution

1 引文 斯高帕斯(Scopus)

摘要

IEEE Std. 1687, or IJTAG, defines flexible serial scan-based architectures for accessing embedded instruments efficiently. In this paper, we present a novel test architecture that employs IEEE Std. 1687 together with an efficient test controller to carry out 3D-IC testing autonomously. The test controller can deliver parallel test data for the IEEE Std. 1687 structures and the cores under test, and provide required control signals to control the whole test procedure. This design can achieve at-speed, autonomous and programmable testing in 3D-ICs. Experimental results show that the additional area and test cycle overhead of this architecture is small considering its autonomous test capability.

原文English
主出版物標題Proceedings - 2016 IEEE 25th Asian Test Symposium, ATS 2016
發行者IEEE Computer Society
頁面215-220
頁數6
ISBN(電子)9781509038084
DOIs
出版狀態Published - 2016 十二月 22
事件25th IEEE Asian Test Symposium, ATS 2016 - Hiroshima, Japan
持續時間: 2016 十一月 212016 十一月 24

出版系列

名字Proceedings of the Asian Test Symposium
ISSN(列印)1081-7735

Other

Other25th IEEE Asian Test Symposium, ATS 2016
國家/地區Japan
城市Hiroshima
期間16-11-2116-11-24

All Science Journal Classification (ASJC) codes

  • 電氣與電子工程

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