摘要
The electrical performance of amorphous indium gallium oxide (a-IGO) thin-film transistors applied as deep-ultraviolet (DUV) phototransistors is investigated. It was found that the bandgap of a-IGO can be engineered by altering its chemical composition. The performance of the phototransistors depended strongly on In2O3 content in the IGO film. When the indium content increases from 21% to 31%, the phototransistor cutoff red-shifted from 280 to 320 nm. The DUV-to-visible rejection ratio and photoresponsivity of the fabricated phototransistors were ∼105 and 0.18 A/W.
原文 | English |
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文章編號 | 7041161 |
頁(從 - 到) | 915-918 |
頁數 | 4 |
期刊 | IEEE Photonics Technology Letters |
卷 | 27 |
發行號 | 8 |
DOIs | |
出版狀態 | Published - 2015 4月 15 |
All Science Journal Classification (ASJC) codes
- 電子、光磁材料
- 原子與分子物理與光學
- 電氣與電子工程