Beating classical imaging limits with entangled photons

Miles Padgett, Ermes Toninelli, Thomas Gregory, Paul Antoine Moreau

研究成果: Conference contribution

5 引文 斯高帕斯(Scopus)

摘要

How can quantum mechanics deliver better imaging performance? Parametric down-conversion sources produce pairs of photons that are correlated in many degrees of freedom, including their spatial positions. By using a camera to detect these pairs of photons it is possible configure imaging systems that can either beat the classical resolution limit or the classical noise limit. We demonstrate how a simple down-conversion source based on a laser and non-linear crystal can be combined with an EMCCD camera to achieve either of these outcomes. Firstly, when both photons pass through the sample, we show a full-field, resolution-enhancing scheme, based on the centroid estimation of the photon pairs. By optimising the software control of the EMCCD camera running in the photon-sparse regime we achieve a resolution enhancement over the equivalent classical limit. Secondly, we show a similar scheme but where only one of the two photons pass through the sample and the other acts as a reference, in this case the ratio of the two resulting images eliminates the background noise of the camera, and background light, achieving an increase in image contrast.

原文English
主出版物標題Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
編輯Selim M. Shahriar, Jacob Scheuer
發行者SPIE
ISBN(電子)9781510625105
DOIs
出版狀態Published - 2019
事件Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology 2019 - San Francisco, United States
持續時間: 2019 2月 22019 2月 7

出版系列

名字Proceedings of SPIE - The International Society for Optical Engineering
10934
ISSN(列印)0277-786X
ISSN(電子)1996-756X

Conference

ConferenceOptical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology 2019
國家/地區United States
城市San Francisco
期間19-02-0219-02-07

All Science Journal Classification (ASJC) codes

  • 電子、光磁材料
  • 凝聚態物理學
  • 電腦科學應用
  • 應用數學
  • 電氣與電子工程

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