@inproceedings{042b3c1faaf9432ca53800431e8ce1bd,
title = "Block reinforcement to optimize lifetime of flash storage devices",
abstract = "With the advances of manufacturing technology and aggressive use of multi-level-cell (MLC) for flash memory, flash memory has faced a serious challenge on its device lifetime due to the fast-decreasing capacity caused by worn-out blocks. In contrast to existing works, we propose a block reinforcement scheme to optimize the guaranteed lifetime of flash storage devices by extending the useable period of flash blocks with limited performance degradation and space overhead. A serious of experiments was conducted to evaluate the efficacy of the proposed scheme and the results are very encouraging.",
author = "Ho, {Chien Chung} and Chang, {Yuan Hao} and Tsao, {Che Wei} and Suei, {Pei Lun}",
note = "Publisher Copyright: {\textcopyright} 2014 IEEE.; 2014 IEEE 3rd Global Conference on Consumer Electronics, GCCE 2014 ; Conference date: 07-10-2014 Through 10-10-2014",
year = "2014",
month = feb,
day = "3",
doi = "10.1109/GCCE.2014.7031339",
language = "English",
series = "2014 IEEE 3rd Global Conference on Consumer Electronics, GCCE 2014",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "717--718",
booktitle = "2014 IEEE 3rd Global Conference on Consumer Electronics, GCCE 2014",
address = "United States",
}