Boundary scan and core-based testing

研究成果: Chapter

2 引文 斯高帕斯(Scopus)

摘要

Boundary scan, also known as the IEEE or JTAG standard, appears to be the most successful test standard ever approved by the IEEE. This chapter focuses on the 1149.1, 1149.6, and 1500 test standards. Test architectures to support these standards are also reviewed in the chapter. Currently, boundary scan is widely used throughout the industry; most commercial computer-aided test tools provide automatic synthesis capability for boundary-scan design. This chapter introduces the boundary-scan family of standards and their current status. The 1149.1 standard is then described in detail. On-chip design to support scan and BIST by 1149.1 and board or system-level controller design for 1149.1 is also briefly addresses in the chapter. It also presents test control architectures to support 1500 design with the plug-and-play feature and hierarchical test structures. This chapter concludes by discussing a comparison between 1149.1 and 1500.

原文English
主出版物標題VLSI Test Principles and Architectures
發行者Elsevier Inc.
頁面557-618
頁數62
ISBN(列印)9780123705976
DOIs
出版狀態Published - 2006 十二月 1

All Science Journal Classification (ASJC) codes

  • Business, Management and Accounting(all)

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