Built-in self-forming, built-in self-test, and built-in self-repair for RRAM yield improvement

Cheng-Wen Wu, C.-Y. Chen, H.-C. Shih, M. Lee, C.-H. Lin, S.-S. Sheu

研究成果: Conference contribution

原文English
主出版物標題VLSI Test Tech. Workshop (VTTW)
出版地Nantou
出版狀態Published - 2011 七月

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