Built-in self-test techniques using Boundary Scan Standard circuitry

C.-H. Tsai, J.-H. Hong, Cheng-Wen Wu

研究成果: Conference contribution

原文English
主出版物標題5th VLSI Design/CAD Symposium
出版地Tainan
頁面257-262
出版狀態Published - 1994 八月

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